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TF Users Group - Proceedings

February, 2005

Metrology of: SOI, SiGe/SGOI, Strained Si, Bipolars and others
  Laurent Kitzinger, SOPRA SA

Modern SOI Materials
  Jean-Pierre Colinge, University of California, Davis

SiGe Epi deposition for NPN HBT base layer
  Sagy Levy, Cypress Semiconductor Process R&D

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